HARRICK PLASMA

Systems and methods for instant total internal reflection fluorescence/structured illumination microscopy

Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed.

Shroff, Hari, Justin TARASKA, John GIANNINI, Abhishek Kumar, Min Guo, Yicong Wu

WO2018039361A1

2018-03-01

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